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|Nexview™ 3D Imaging and Surface Metrology System With High Precision, Flexibility and Speed Introduced by Zygo|
"One tool for all surfaces, without compromise."™
The Nexview profiler is optimized for non-contact surface metrology of an extensive variety of samples and surfaces from the very smooth to the very rough. With sub-nanometer vertical resolution at all magnifications, metrologists need not sacrifice precision for changes in field of view. Using non-contact 3D technology, the system will safely measure fragile and transparent materials without altering the test surface. Its high speed performance, even on steep slopes up to 85 degrees, lets the Nexview profiler save time compared to magnification dependent technologies.
Making the most of multiple technological advances, the Nexview profiler and its Mx™ software package produce extremely high fidelity surface topography maps for measuring roughness, flatness, angles, films, steps, and more. This new software platform acts as a simple to use and learn single interface for system control and data analysis, providing rich interactive 3D maps, quantitative topography information, and intuitive measurement navigation.
With simple software application recipes, a wide range of objective magnifications, and convenient automation setup built-in, the Nexview profiler accommodates multiple parts and setups. Recipe changes are quick and easy; with new recipes typically taking only minutes to configure. Additionally, specialized software modules for measurement in the presence of transparent films and 2D vision analysis are available for expanded functionality.
"As a new concept in surface mapping, the Nexview profiler is a significant leap forward in data collection and interactive surface analysis. These are in high demand for our customers with challenging and high precision requirements. It enables a wide variety of topography applications previously not addressed, and expands our market opportunities," commented
ZYGO is launching the Nexview profiler today at the SPIE Optics + Photonics exhibition in