Products Optical Surface Profilers Laser Interferometers Absolute Position Measurement Semiconductor Systems Stage Position Metrology Trade-in & Upgrade Program  New!

Applications Form & Roughness of Precision Parts Form, Waviness, Roughness Surface Finish Regions Analysis  New! Tribology Automated Image Inspection Step Height Dynamic Metrology Film Thickness Transmitted Wavefront Radius of Curvature Homogeneity Position & Angle Measurement


Automated Image Inspection Vision Software Suite for MetroPro®

With the Vision Software Suite for MetroPro®, users can leverage the power of the NewView™ Series of optical profilers to perform rapid and accurate lateral and vertical metrology from the same data, producing high-fidelity 2D and 3D images. This simultaneous measurement eliminates the possibility that the part can change between lateral and vertical metrology operations.

The Vision Software Suite (VSS) for MetroPro® makes this process simple and straightforward by adding the power of Cognex VisionPro to the surface characterization capabilities of ZYGO's MetroPro®, performing tasks such as pattern matching and dimensional measurement.

Inquiry Form
Please use the form below to contact us with any questions you have regarding Automated Image Inspection, or any other ZYGO metrology applications.

First Name * Last Name *
Phone Number E-mail Address *
Company or Organization * Job Title or Function*
Street Address City
State/Province * Zip/Postal Code
Country *
If you experience any difficulty submitting this form, please contact:
Please type your inquiry below:
* Required entries  

Note: If you experience any difficulty submitting this form, please contact: webmaster@zygo.com


AMETEK, Inc. Logo Application Notes

Note: Login Required to download Application Notes; Click for details.

Contact ZYGO today to learn more about the Vision Software Suite for MetroPro®!