Optical Surface Profilers
Absolute Position Measurement
Stage Position Metrology
Trade-in & Upgrade Program New!
Applications Form & Roughness of Precision Parts Form, Waviness, Roughness Surface Finish Regions Analysis New! Tribology Automated Image Inspection Step Height Dynamic Metrology Film Thickness Transmitted Wavefront Radius of Curvature Homogeneity Position & Angle Measurement
Film Thickness Surface Profiling Applications
"TopSlice" analysis singles out the film's top surface for topography measurement, while "FilmSlice" identifies the top surface and substrate surface to allow calculation of a film thickness map. "FilmSlice" also permits topography measurement of the substrate surface.
Regardless of the application, ZYGO has a NewView™ optical profiler to fill the need.
Inquiry FormPlease use the form below to contact us with any questions you have regarding Film Thickness metrology, or any other ZYGO metrology applications.
Note: If you experience any difficulty submitting this form, please contact: firstname.lastname@example.org
Contact ZYGO today to learn more about film thickness metrology!