Products Optical Surface Profilers Laser Interferometers Absolute Position Measurement Semiconductor Systems Stage Position Metrology Trade-in & Upgrade Program  New!

Applications Form & Roughness of Precision Parts Form, Waviness, Roughness Surface Finish Regions Analysis  New! Tribology Automated Image Inspection Step Height Dynamic Metrology Film Thickness Transmitted Wavefront Radius of Curvature Homogeneity Position & Angle Measurement


Step Height Surface Profiling Applications

Many precision manufacturing processes require step height measurements with a high degree of repeatability and accuracy. ZYGO's NewView™ optical profilers can measure step heights up to 20000 µm with sub-nanometer resolution.

Depending on the model, ZYGO's NewView™ surface profilers can measure a variety of step heights. The height difference between two discontinuous planes, up to 20 mm, is most effectively handled by ZYGO's Coherence Scanning Interferometry (CSI) technology. It is also possible to measure the angle of the surfaces using this technique.

Inquiry Form
Please use the form below to contact us with any questions you have regarding Step Height measurement, or any other ZYGO metrology applications.

First Name * Last Name *
Phone Number E-mail Address *
Company or Organization * Job Title or Function*
Street Address City
State/Province * Zip/Postal Code
Country *
If you experience any difficulty submitting this form, please contact:
Please type your inquiry below:
* Required entries  

Note: If you experience any difficulty submitting this form, please contact: webmaster@zygo.com


AMETEK, Inc. Logo
Contact ZYGO today to learn more about step height metrology!