Products Optical Surface Profilers Laser Interferometers Semiconductor Systems Stage Position Metrology Testing & Certification Services

Applications Form & Roughness of Precision Parts Form, Waviness, Roughness Surface Finish Tribology  New! Automated Image Inspection Step Height Dynamic Metrology Film Thickness Transmitted Wavefront Radius of Curvature Homogeneity Position & Angle Measurement


Form, Waviness, Roughness

Hip Joint Implant Socket Wear Analysis
From our Large Aperture systems, to our NewView™ series of Optical Profilers, there's a ZYGO metrology system for virtually every type of surface you need to measure. Click on areas of the chart below to find out more about each of our surface metrology solutions.

Note: The NewView™ product line can measure surfaces with as little as 1% reflectance. The GPI™ and VeriFire™ product lines are intended to measure polished or super-finished surfaces. Surface Form Product Comparison Chart

Inquiry Form
Please use the form below to contact us with any questions you have regarding Surface Form, Waviness & Roughness measurement, or any other Zygo metrology applications.

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Application Notes

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