Optical Surface Profilers
Stage Position Metrology
Testing & Certification Services
Applications Form & Roughness of Precision Parts Form, Waviness, Roughness Surface Finish Tribology New! Automated Image Inspection Step Height Dynamic Metrology Film Thickness Transmitted Wavefront Radius of Curvature Homogeneity Position & Angle Measurement
Form, Waviness, RoughnessOptical Profilers, there's a ZYGO metrology system for virtually every type of surface you need to measure. Click on areas of the chart below to find out more about each of our surface metrology solutions.
Note: The NewView™ product line can measure surfaces with as little as 1% reflectance. The GPI™ and VeriFire™ product lines are intended to measure polished or super-finished surfaces.
Inquiry FormPlease use the form below to contact us with any questions you have regarding Surface Form, Waviness & Roughness measurement, or any other Zygo metrology applications.
Contact ZYGO today to learn more about form, waviness, and roughness metrology!
Zygo receives order in excess of $3M from Asian IC substrate manufacturer for multiple 3D/2D metrology systems
Zygo receives $3M order from major consumer products company to deliver multiple non-contact profiling systems
From concept, to prototype, to volume production Zygo's Optical Systems does it all. See them at #PhotonicsWest.