Products Optical Surface Profilers Laser Interferometers Absolute Position Measurement  new! Semiconductor Systems Stage Position Metrology Testing & Certification Services

Applications Form & Roughness of Precision Parts Form, Waviness, Roughness Surface Finish Regions Analysis  New! Tribology Automated Image Inspection Step Height Dynamic Metrology Film Thickness Transmitted Wavefront Radius of Curvature Homogeneity Position & Angle Measurement


Form, Waviness, Roughness

Form, waviness, and roughness measurements
From our Optical Profilers to our Large Aperture Laser Interferometers, ZYGO's metrology systems cover a wide range of spatial frequencies, enabling precise, non-contact metrology of surface characteristics from roughness and texture to low spatial frequency form error and deviation.

These metrology systems deliver visual and quantitative 3D (ISO 25178) surface measurements and advanced characterization, including PSD analysis, aspheric form, super-smooth roughness, and more.

Contact ZYGO to discover more about how our suite of metrology solutions can provide you with the capability to control your process and improve quality – from simple R&D tools to automated production systems. Surface Form Product Comparison Chart

Inquiry Form
Please use the form below to contact us with any questions you have regarding Surface Form, Waviness & Roughness measurement, or any other ZYGO metrology applications.

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Contact ZYGO today to learn more about form, waviness, and roughness metrology!