Products Optical Surface Profilers Laser Interferometers Absolute Position Measurement Semiconductor Systems Stage Position Metrology Trade-in & Upgrade Program  New!

Applications Form & Roughness of Precision Parts Form, Waviness, Roughness Surface Finish Regions Analysis  New! Tribology Automated Image Inspection Step Height Dynamic Metrology Film Thickness Transmitted Wavefront Radius of Curvature Homogeneity Position & Angle Measurement


Transmitted Wavefront Optical Testing Applications

ZYGO offers a comprehensive range of metrology solutions for measuring transmitted wavefront quality and homogeneity of discrete components and assembled lens systems, covering a wide range of operating wavelengths. Click on areas of the chart below to find out more about each of our transmitted wavefront metrology solutions.



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Please use the form below to contact us with any questions you have regarding Transmitted Wavefront measurement, or any other ZYGO metrology applications.

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Contact ZYGO today to learn more about transmitted wavefront metrology!