Flat Panel Metrology
Advanced Process Metrology for Flat Panel Display Manufacturing
Key Features:
Increase Yields and Lower Operating Costs
Boost Productivity and Efficiency
Improve Time-to-Market
Optimize Process Knowledge
Shorten Cycle Times and Ramp-Up
Reduce Scrap, Re-work, and Down Time
Flat Panel Metrology (FPM) Systems maximize your process so you can produce more panels with higher yields - in less time at a lower cost. Important photo-spacer (PS) and Multi-domain Vertical Alignment (MVA) features can be easily characterized for immediate visualization and quantitative analysis for rapid process feedback.
The unique OneShot™ measurement software permits simultaneous inspection of:
Photo Spacers: height, top Dx/Dy, top area, bottom Dx/Dy, bottom area
MVA: height, bottom width
Overlay: on-chip PS to RGB and MVA to RGB
RGB Color Filter: height difference, top surface topography, thickness map, bottom surface topography
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