Photovoltaic Panel Solutions Increasing efficiency while lowering costs

NewView™ 3DPV-TF

TCO Film Thickness Map

• TCO: Simultaneous measurement of both TCO surface roughness and thickness, anywhere on the panel without contact.

• Laser Scribe: Depth, Width, Profile, and Debris.

NewView™ 3DPV-W

3D Plot of Cell Edge Isolation

• Wafer Texture: Minimize etching time while removing saw damage and increasing photon absorption.

• Conductor Grid: Unique 3D Cross Sectional Area metrology helps reduce Ag variations and waste.

• Laser - Edge Isolation: Helps optimize edge isolation and minimize surface debris.