|Products Optical Surface Profilers Laser Interferometers Semiconductor Systems Stage Position Metrology Testing & Certification Services||
Semiconductor SystemsZYGO's semiconductor metrology systems enable manufacturers to improve the quality and yield of their processes, while lowering metrology costs.
Metrology, Process Control and
CSP-3000™ – 100% inspection of flip-chip CSP (FC-CSP) strips. Inspects a mixture of round and flat bumps in a single measurement – the only inspection tool capable of measuring both.
Contact ZYGO today to learn more about ZYGO's metrology solutions for Semiconductor package manufacturing!
›› Zygo stockholders approve merger with AMETEK, Inc. for $19.25/share. Transaction anticipated to close on June 20,...
›› Zygo receives order in excess of $3M from Asian IC substrate manufacturer for multiple 3D/2D metrology systems