|Products Optical Surface Profilers Laser Interferometers Semiconductor Systems Stage Position Metrology Testing & Certification Services||
Semiconductor SystemsZYGO's semiconductor metrology systems enable manufacturers to improve the quality and yield of their processes, while lowering metrology costs.
Metrology, Process Control and
CSP-3000™ – 100% inspection of flip-chip CSP (FC-CSP) strips. Inspects a mixture of round and flat bumps in a single measurement – the only inspection tool capable of measuring both.
Contact ZYGO today to learn more about ZYGO's metrology solutions for Semiconductor package manufacturing!
Free surface analysis of your part with Zygo's new Nexview™ 3D surface profiler. #F13MRS Booth 813 @Materials_MRS
One tool for all surfaces, without compromise.™ Zygo's Nexview™ Next-gen optical profiler. @Quality_Expo Booth 251
Nexview™ Zygo's new next-gen noncontact profiler, now measure even more surfaces. @Quality_Expo Booth 251