|Products Optical Surface Profilers Laser Interferometers Semiconductor Systems Stage Position Metrology Testing & Certification Services||
Semiconductor SystemsZYGO's semiconductor metrology systems enable manufacturers to improve the quality and yield of their processes, while lowering metrology costs.
Metrology, Process Control and
CSP-3000™ – 100% inspection of flip-chip CSP (FC-CSP) strips. Inspects a mixture of round and flat bumps in a single measurement – the only inspection tool capable of measuring both.
Contact ZYGO today to learn more about ZYGO's metrology solutions for Semiconductor package manufacturing!
Zygo receives order in excess of $3M from Asian IC substrate manufacturer for multiple 3D/2D metrology systems
Zygo receives $3M order from major consumer products company to deliver multiple non-contact profiling systems
From concept, to prototype, to volume production Zygo's Optical Systems does it all. See them at #PhotonicsWest.