|Products Optical Surface Profilers Laser Interferometers Semiconductor Systems Stage Position Metrology Testing & Certification Services||
Semiconductor SystemsZYGO's semiconductor metrology systems enable manufacturers to improve the quality and yield of their processes, while lowering metrology costs.
Metrology, Process Control and
CSP-3000™ – 100% inspection of flip-chip CSP (FC-CSP) strips. Inspects a mixture of round and flat bumps in a single measurement – the only inspection tool capable of measuring both.
Contact ZYGO today to learn more about ZYGO's metrology solutions for Semiconductor package manufacturing!
Zygo stockholders approve merger with AMETEK, Inc. for $19.25/share. Transaction anticipated to close on June 20,...
Zygo receives order in excess of $3M from Asian IC substrate manufacturer for multiple 3D/2D metrology systems