|Products Optical Surface Profilers Laser Interferometers Semiconductor Systems Stage Position Metrology Testing & Certification Services||
Semiconductor SystemsZYGO's semiconductor metrology systems enable manufacturers to improve the quality and yield of their processes, while lowering metrology costs.
Metrology, Process Control and
CSP-3000™ – 100% inspection of flip-chip CSP (FC-CSP) strips. Inspects a mixture of round and flat bumps in a single measurement – the only inspection tool capable of measuring both.
Contact ZYGO today to learn more about ZYGO's metrology solutions for Semiconductor package manufacturing!
Zygo® measures surfaces of microbial biofilms, PTFE nanocomposite films & silver tantalate coatings, with high precision #STLE2013 Booth 221
Zygo® 3D optical surface profilers measures microsurface features with nanometer-scale precision. #STLE2013 Booth 221
#STLE2013 Zygo Booth 221 for high-precision quantitative 3D measurements of surfaces and microstructural properties.