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CP7300™ Wafer Metrology System
Fast accurate, repeatable 3D areal surface mapping.
Superior vertical resolution (~0.1 nm) in a single measurement.
Automated sample measurement and positioning capabilities.
Standard and custom solutions and configurations available.
Programmable and automated measurement sequences and sample positioning allows for surface characterization at multiple sites and locations. Integral to each system is a comprehensive and powerful software analysis package with application-specific modules, providing full 3D imaging and data reporting of many surface topography parameters.
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Zygo® measures surfaces of microbial biofilms, PTFE nanocomposite films & silver tantalate coatings, with high precision #STLE2013 Booth 221
Zygo® 3D optical surface profilers measures microsurface features with nanometer-scale precision. #STLE2013 Booth 221
#STLE2013 Zygo Booth 221 for high-precision quantitative 3D measurements of surfaces and microstructural properties.