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Surface Profilers NewView™ 600 Series NewView™ 7000 Series NewView™ 7100 NewView™ MPT


NewView™ 7000 Series 3D Optical Surface Profilers

NewView™ 7300 System
The NewView™ 7000 Series white light interferometers are powerful tools for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 20000 µm at high speeds, independent of surface texture, magnification, or feature height! 3D MetroPro® Plot

Using ZYGO's patented scanning white light interferometry (SWLI) technology, the NewView™ 7000 series 3D optical surface profilers easily measure a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces.

Two Models - Unlimited Potential
The Model 7200 and 7300 optical profilers both offer high-accuracy measurements, differing mainly in their standard features. The Model 7300 has several features that maximize capability and convenience.

Key Features:

• Fast noncontact measurements

• Sub-angstrom Z resolution

• Leading-edge precision & gage capability

• Enhanced optical imaging


Brochures Spec Sheets Manuals Application Notes Technical Papers

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Contact ZYGO today to learn more about the NewView™ 7000 Series!

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