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NewView™ 7300 3D Optical Surface Profiler

NewView™ 7300 System
The NewView™ 7300 white light interferometer (profilometer) is a powerful tool for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 20000 µm at high speeds, independent of surface texture, magnification, or feature height! 3D MetroPro® Plot

Using ZYGO's Coherence Scanning Interferometry (CSI) technology, the NewView™ 7300 3D optical surface profiler easily measures a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces.

Key Features:

• Fast non-contact measurements

• Sub-angstrom Z resolution

• Leading-edge precision & gage capability

• Enhanced optical imaging

Inquiry Form
Please use the form below to contact us with any questions you have regarding the NewView™ 7300 Series 3D Optical Surface Profiler, or surface profiling in general.

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