|Products Optical Surface Profilers Laser Interferometers Semiconductor Systems Stage Position Metrology Testing & Certification Services||
ZeMapper™ Optical Profiler
Rigid platform improves stability and increases accuracy by reducing vibration-induced errors.
Point and click move-to-measure automation.
Computer-controlled 5-axis motorized precision stages.
High-res, low-noise, 4 megapixel sensor delivers superior detail.
StageView™ Part Placement FeatureThe StageView feature shows you a wide-field preview (up to 120 mm x 100 mm) of your test sample on the stage. Just pick the point you want to measure, select magnification, and be there. The computer-controlled motorized precision stages translate the sample to that exact location, eliminating positioning guesswork.
Field StitchingNeed precise measurement of a larger area? The advanced field stitching feature makes it easy, even on super-smooth nearly featureless surfaces! The system's 4-megapixel low-noise camera captures every minute detail with unsurpassed clarity, capturing up to four million data points per measurement. Setting up the stitching area is a snap using the part placement image provided by the StageView feature.
Extreme Precision on Smoothest SurfacesZeMapper demonstrates its versatility by offering multiple measurement technologies in one instrument. Phase Shifting Interferometry (PSI) offers sub-Angstrom performance on super-smooth surfaces, while Scanning White Light Interferometry (SWLI) enables precision measurement of surface features and relative step heights of discontinuous surfaces. Optionally, a films analysis package enables characterization of optically transparent films that otherwise could not be profiled interferometrically. And ZeMapper's unique structural configuration enables both large area inspection and high magnification in a rigid package. A low center of gravity and bridge architecture reduce vibration-induced errors.
ZeMaps™ SoftwareThe proprietary ZeMaps acquisition and analysis software delivers precise measurements of roughness, step height, volume, and shape in both 2D and 3D graphical plots, as well as numeric results. This 64-bit multi-threading application supports very large data sets, making full use of multi-core processors and memory expansions. It keeps the system's automation features brisk, while presenting the user with a highly responsive graphical interface.
Inquiry FormPlease use the form below to contact us with any questions you have regarding the Zemapper™ Optical Profiler, or surface profiling in general.
Contact ZYGO today to learn more about the ZeMapper Optical Profiler!
Zygo stockholders approve merger with AMETEK, Inc. for $19.25/share. Transaction anticipated to close on June 20,...
Zygo receives order in excess of $3M from Asian IC substrate manufacturer for multiple 3D/2D metrology systems