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Document |
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| MultiSurf Application |
OMP-0376C |
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| The MetroPro® MultiSurf Application provides a complete set of controls, plots, and results, to
isolate areas of interest on the surface of your test part. In simple terms, it is used to segment or
divide a single data set into multiple test areas. And once the control settings are established,
similar parts can be measured and test areas isolated automatically. |
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| Angle Measurement Application |
OMP-0381E |
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| The Angle Measurement Application is used to measure the mechanical wedge of an optical
element having nonparallel surfaces, and the 90° angle error of right-angle prisms. The Angle
Measurement Application can be used with the Mark IVxp, GPI™, and VeriFire™ instruments. |
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| Static Fringe Application |
OMP-0382B |
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| The Static Fringe Application is used to evaluate data acquired on interferometers without phase
modulation. The static fringe data may be acquired from a large aperture interferometer, or it can
be a scanned image input from a scanner. It requires an input vertical fringe pattern with 15 to 30
fringes. |
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| Zernike Application |
OMP-0383B |
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| The Zernike Application is designed for the advanced user who is evaluating wavefronts in terms
of Zernike polynomials. It also provides controls for generating polynomials and wavefronts
without the actual test optics. Wavefronts can be subtracted or added to current data sets. |
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| Corner Cube Application |
OMP-0384C |
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| The Corner Cube Application is used to measure corner cube prisms or retroreflectors.
A corner cube consists of three internally reflecting facets forming 90° angles with each other.
The application is designed for use with the ZYGO GPI™ XP and the Mark IVxp interferometers.
Any type of corner cube can be evaluated, regardless of whether it is constructed of three
individual mirrored surfaces or a single piece of glass. Three categories of results are provided:
dihedral angle error, beam deviation, and transmitted wavefront quality. |
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| Disk Flatness Application |
OMP-0385D |
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| The Disk Flatness Application is tailored to measuring and quantifying the surface of hard disk
platters, and provides measurement analysis of Radial Slope, Axial Slope, Axial Velocity, Axial
Acceleration, and Quadrant Peak / Valley. Axial Acceleration (the rate at which the magnetic head's
Z-axis velocity is changing) is calculated from the Axial Velocity calculations and time. Both negative
and positive acceleration results are provided. |
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| PHom Polished Homogeneity Application |
OMP-0386B |
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| The Polished Homogeneity or PHom Application is used to measure the homogeneity of
polished glass; the polished glass test part must have wedge. Homogeneity is a measure of the
variation in the refractive index within a material. The PHom measurement removes errors in the
test cavity as well as errors from both surfaces of the sample. It provides information about the
internal quality of glass by identifying optical imperfections. PHom is frequently used as a
measurement for raw material that will undergo additional manufacture before becoming part of
an optical system. |
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| Three Flat Application |
OMP-0387B |
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| The Three Flat Application is used to measure the absolute departure of a flat with
respect to an ideal flat, with a precision of, or better than, 1/100 of a wavelength. Three flat
testing requires two Transmission Flats, a test part (flat), and a 2-Axis Mount. Three series of
measurements provide coincident data over a vertical diameter; four measurements provide
coincident data also over the horizontal diameter. Results are provided along two diameters on
any one or all three of the flats used for the test. Only vertical data is obtainable on large aperture
systems, because of the difficulty in precisely rotating a large flat. |
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| Two Sphere Application |
OMP-0388B |
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| The Two Sphere Application is used to measure the wavefront or surface quality of
spherical optics. Two Sphere testing requires one Transmission Sphere, an Alignment Fixture
mounted on the interferometer, a 5-Axis Mount with a Self Centering Element Holder, and a test
part (concave or convex). |
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| Radius Scale |
OMP-0389B |
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| The Radius Scale Application is used to measure radius of curvature in conjunction with a GPI™ or
VeriFire™ interferometer and one of the radius of curvature hardware options (Digital Radius Scale or
Interferometric Radius Slide). |
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