|ZYGO’S DISK THICKNESS MEASUREMENT AND SORTING SYSTEM IS A HIT|
MIDDLEFIELD, CONNECTICUT (March 23, 1998)......Zygo Corporation (NASDAQ:ZIGO) announced today that its automated disk thickness measurement and sorting system, introduced to the data storage industry at DISKCON in September 1997, has already captured multiple orders from multiple customers. The Company has recently installed the first of these systems. The systems are capable of measuring disk thickness on 25 disks at a time and sorting the disks into 10 predefined, customer-selected, thickness ranges. They are engineered specifically to fit within the manufacturing process of a customer's facility and provide a fully automated work cell solution.
Ahmad Akrami, vice president in charge of the automation business at ZYGO, recently commented, "The disk thickness measurement system is an excellent example of the strategic thrust of Zygo…taking the metrology our customers need directly to their manufacturing floors and providing them with fully integrated solutions to their most difficult manufacturing process problems."
Zygo Corporation designs, develops, manufactures, and markets high performance measurement and yield improvement instruments, systems, and accessories used in high technology industries. The Company is headquartered in Middlefield, Connecticut, and also has operations in Asslar, Germany; Longmont, Colorado; and in Newbury Park, Sunnyvale, and Simi Valley, California.
This press release may contain forward-looking statements within the meaning of Section 27A of the Securities Act of 1933, as amended, and Section 21E of the Securities Exchange Act of 1934, as amended, which reflect the Company's current judgment on certain issues. Because such statements apply to future events, they are subject to risks and uncertainties that could cause the actual results to differ materially. Important factors which could cause actual results to differ materially are described in the Company's reports on Form 10-K and 10-Q on file with the Securities and Exchange Commission.
|Microscopy & µanalysis||08/06|
|ASPE Annual Meeting||11/06|
|MRS Fall Meeting||11/27|
|(Click for a complete list)|