|About Us Company Profile News Releases Trade Show Schedule Manufacturing Locations Sales/Service Offices How to Get to ZYGO Patent Information ISO Registrations Conflict Minerals Policy||
|ZYGO RECEIVES PHOTONICS CIRCLE OF EXCELLENCE AWARD FOR MESA|
MIDDLEFIELD, CONNECTICUT (May 15, 1998)......Zygo Corporation (NASDAQ:ZIGO) announced today that it has received its fifth Photonics Circle of Excellence Award. The award was received by ZYGO for its MESA system as one of the 25 most technically innovative new products of the year in the photonics industry. MESA, introduced in late 1997, provides customers the ability to measure the surface shape, in three dimensions, of parts which are nonspecular and previously could not be measured using standard interferometry in less than five seconds. The advantages of ZYGO's patented approach are its noncontact, high speed, and large field-of-view as well as its three-dimensional capability. Additionally, the MESA system has many features previously not available in interferometric measurement systems including a long working distance, ability to measure from nonspecular to specular parts, a reduction in vibration sensitivity and departure tolerance of 20 times that of standard interferometry, as well as high spatial resolution.
Zygo Corporation designs, develops, manufactures, and markets high performance measurement and yield improvement instruments, systems, and accessories used in high technology industries. The Company is headquartered in Middlefield, Connecticut, and also has operations in Asslar, Germany; Longmont, Colorado; and in Newbury Park, Sunnyvale, and Simi Valley, California.
This press release may contain forward-looking statements within the meaning of Section 27A of the Securities Act of 1933, as amended, and Section 21E of the Securities Exchange Act of 1934, as amended, which reflect the Company's current judgment on certain issues. Because such statements apply to future events, they are subject to risks and uncertainties that could cause the actual results to differ materially. Important factors which could cause actual results to differ materially are described in the Company's reports on Form 10-K and 10-Q on file with the Securities and Exchange Commission.
|Defense+Sensing||04/17 - 04/19|
|CONTROL||04/24 - 04/27|
|Optatec||05/15 - 05/17|
|STLE Ann. Mtg.||05/20 - 05/24|
|SAMPE||05/22 - 05/23|
|Astro. Tel. & Inst.||06/12 - 06/14|
|SEMICON West||07/10 - 07/12|
|(Click for a complete list)|