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Please Note: Zygo Corporation is conducting business as usual; however most offices are closed to non-employees and are operating with reduced on-premises staffing in compliance with COVID-19 social distancing practices. Please contact us with any questions, and prior to shipping materials to any of our locations.

ZYGO Blog Site

This page provides a list of all available ZYGO blog posts.

Date Title
09/27/2018 Using Grazing Incidence Interferometry to Measure Large or Non-Specular Surfaces
09/11/2018 Process Metrology Helps Ensure Quality of Smartphone Camera Lenses
09/10/2018 Precision Lead Angle Metrology Improves Shaft Seals and Engine Efficiency
07/09/2018 Precision Gear Tooth Metrology Helps Automaker Silence Humming Differential
06/18/2018 Measuring Roughness on Super-Smooth Surfaces
06/15/2018 New Smart Setup Feature Streamlines Precision Surface Metrology
06/06/2018 Think you know ZYGO? Check out these six surprising facts and statistics...
03/17/2018 World Metrology Day, 2018
03/16/2018 Demands of Smartphone Camera Quality Drive Manufacturing Process Improvements
03/08/2018 Reliable and Precise Measurement of Optics in Production Environments - the Fast and Easy Way!
03/02/2018 Machine Vision Tools Enhance 2D and 3D Surface Metrology and Inspection
02/08/2018 ZYGO Laser Interferometer Appears in TV Spot
01/30/2018 An Inside Look at ZYGO's Precision Optical Manufacturing Operations
01/25/2018 ZYGO Introduces Next-Generation 3D Optical Profilers at Photonics West 2018
11/22/2017 Laser Focus World Includes ZYGO's ZPS System in "Top 20 Photonics Technology Picks for 2017"
11/22/2017 Highest Quality Laser Interferometer Measurements Require Highest Quality Reference Optics
11/22/2017 Measuring Wavefront Distortion of Optical Windows Using Laser Interferometry
11/07/2017 ZYGO's Verifire™ HDX Laser Interferometer Delivers Industry-Leading Resolution
10/26/2017 Current Trends of Optical Metrology – An interview with Dr. Peter de Groot
10/25/2017 Optical Metrology for Precision Engineers – A Full-Day Short Course to be Presented at the 32nd Annual Meeting of ASPE
10/19/2017 Advanced Model Based Films Analysis from ZYGO Enables Full Metrology of Films as Thin as 50 nm
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