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Applications Form & Roughness of Precision Parts Form, Waviness, Roughness Surface Finish Regions Analysis  New! Tribology Automated Image Inspection Step Height Thin Film Measurement Transmitted Wavefront Radius of Curvature Optical Homogeneity Position & Angle Measurement

Step Height Surface Profiling Applications

Many precision manufacturing processes require step height measurements with a high degree of repeatability and accuracy. ZYGO's NewView™ optical profilers can measure step heights up to 20000 µm with sub-nanometer resolution.

Depending on the model, ZYGO's NewView™ surface profilers can measure a variety of step heights. The height difference between two discontinuous planes, up to 20 mm, is most effectively handled by ZYGO's Coherence Scanning Interferometry (CSI) technology. It is also possible to measure the angle of the surfaces using this technique.

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Please use the form below to contact us with any questions you have regarding Step Height measurement, or any other ZYGO metrology applications.

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Contact ZYGO today to learn more about step height metrology!

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