Optical Surface Profilers
Absolute Position Measurement
Stage Position Metrology
Trade-in & Upgrade Program New!
Applications Form & Roughness of Precision Parts Form, Waviness, Roughness Surface Finish Regions Analysis New! Tribology Automated Image Inspection Step Height Dynamic Metrology Film Thickness Transmitted Wavefront Radius of Curvature Homogeneity Position & Angle Measurement
Step Height Surface Profiling ApplicationsMany precision manufacturing processes require step height measurements with a high degree of repeatability and accuracy. ZYGO's NewView™ optical profilers can measure step heights up to 20000 µm with sub-nanometer resolution.
Depending on the model, ZYGO's NewView™ surface profilers can measure a variety of step heights. The height difference between two discontinuous planes, up to 20 mm, is most effectively handled by ZYGO's Coherence Scanning Interferometry (CSI) technology. It is also possible to measure the angle of the surfaces using this technique.
Inquiry FormPlease use the form below to contact us with any questions you have regarding Step Height measurement, or any other ZYGO metrology applications.
Note: If you experience any difficulty submitting this form, please contact: firstname.lastname@example.org
Contact ZYGO today to learn more about step height metrology!