![]() |
![]() |
![]() |
![]() |
|
![]() |
![]() |
|||
Products
3D Optical Profilers
Laser Interferometers
Position Metrology Systems
Custom Metrology Solutions
Trade-in & Upgrade Program
Applications Form & Roughness of Precision Parts Form, Waviness, Roughness Surface Finish Regions Analysis New! Tribology Automated Image Inspection Step Height Thin Film Measurement Transmitted Wavefront Radius of Curvature Optical Homogeneity Position & Angle Measurement |
Form, Waviness, RoughnessFrom our Optical Profilers to our Large Aperture Laser Interferometers, ZYGO's metrology systems cover a wide range of spatial frequencies, enabling precise, non-contact metrology of surface characteristics from roughness and texture to low spatial frequency form error and deviation.These metrology systems deliver visual and quantitative 3D (ISO 25178) surface measurements and advanced characterization, including PSD analysis, aspheric form, super-smooth roughness, and more.
Contact ZYGO to discover more about how our suite of metrology solutions can provide you with the capability to control your process and improve quality – from simple R&D tools to automated production systems.
Inquiry Form
Please use the form below to contact us with any questions you have regarding Surface Form, Waviness & Roughness measurement, or any other ZYGO metrology applications.
Note: ** You may withdraw this consent at any time using the "unsubscribe" link at the bottom of any page on this web site. |
Application Notes ![]() Note: Login Required to download Application Notes; Click for details.
Contact ZYGO Today
![]() ![]() ![]() |
||
Privacy and Cookie Policy
Privacy Policy Inquiry Form
Unsubscribe
×
Enter the email address you would like to unsubscribe from future contact...
|