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Metrology Systems 3D Optical Profilers Laser Interferometers Nano-Position Sensors Custom Metrology Solutions

Laser Interferometers Verifire™ Verifire™ HD Verifire™ HDX DynaFiz® Mx™ Software Interferometer Accessories

Special Applications Verifire™ MST Infrared Interferometers Verifire™ VTS Verifire™ XL Large Aperture Systems Upgrades

Unique Technologies
QPSI™ DynaPhase®

Mx™ Software Instrument Control & Data Analysis Software for ZYGO Laser Interferometers

Mx Software Screen
Mx Software, Zernike Analysis Results
ZYGO's proprietary Mx™ analysis software offers a wide range of operational features and a comprehensive data analysis suite including Zernike, slopes, PSD/MTF/PSF, prism angle, corner cube, and many more.

It has a simple and intuitive interface for efficient operation and easy learning curve. Interactive and detailed data plots show full area data in 2D or 3D; profile slices, slope analysis, and PSD views are also standard capability.

This full-featured instrument control, data acquisition, and analysis software package also has the tools for integrating with manufacturing processes, running automation, and reporting critical measurement parameters. With built-in SPC, pass/fail indication, data reporting and run charts, production quality analysis is simplified.

Using a simple workflow-based concept, users easily navigate the metrology experience from setup through analysis and reporting. It also includes Python-based scripting and remote access for maximum flexibility and integration into complex test setups.

SmartAveraging® Technology

Watch: How to use the SmartAveraging® feature of ZYGO's Mx software.
Measurement averaging is an effective method of reducing the effects of random noise sources such as air turbulence, but determining the best number of averages can be tricky... too few reduces the effectiveness; too many wastes time. SmartAveraging® technology is an exclusive feature of ZYGO's Mx™ software that automatically calculates and uses the optimum number of averages. SmartAveraging technology removes guesswork, minimizes operator variability, and ensures confidence in the measurement result.

Mx Highlights:

Robust measurements – New technology reveals topography data nearly everywhere there is a part, even on rough and angled surfaces.

Interactive 3D plots – zoom, pan, rotate, and update results in real time.

Flexible Analyses – a wide array of quantitative results, data views, and filters are included.

Intuitive user interface with a workflow-based design makes it easy to learn and use.

Built in SPC analysis tools track results, monitor pass-fail criteria, and track process statistics.

Inquiry Form
Please use the form below to contact us with any questions you have regarding ZYGO's laser interferometer systems, or precision optical metrology in general.

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