3D Optical Profilers
Custom Metrology Solutions
Mx™ Software Instrument Control & Data Analysis Software for ZYGO Laser Interferometers
It has a simple and intuitive interface for efficient operation and easy learning curve. Interactive and detailed data plots show full area data in 2D or 3D; profile slices, slope analysis, and PSD views are also standard capability.
FlexibilityStandard and customizable features to suite any application
This full-featured instrument control, data acquisition, and analysis software package has the tools for integrating with manufacturing processes, running automation, and reporting critical measurement parameters. With built-in SPC, pass/fail indication, data reporting and run charts, production quality analysis is simplified.
NEW! Custom Workspace feature enables the most flexible and easy-setup GUI to address a wide range of applications, from the most simplistic operator-based interface including touchscreen support to a full-featured comprehensive data analysis and reporting format for the engineering or R&D lab.
Mx also includes Python-based scripting and remote access to further expand the capability of the software integrate into complex test setups, or further simplify and automate production applications.
SmartAveraging® TechnologyMinimize time and measurement uncertainty
Watch: How to use the SmartAveraging® feature of ZYGO's Mx software.
Robust measurements – ZYGO proprietary QPSI™ and DynaPhase® measurement acquisition modes eliminate the effects of vibration in difficult metrology environments.
• Intuitive user interface with Custom Workspace enables easy to set up GUI for any application.
• Flexible Analyses – a wide array of quantitative results, data views, and filters are included.
• Built in SPC analysis tools track results, monitor pass-fail criteria, and track process statistics.
• Interactive 3D plots – zoom, pan, rotate, and update results in real time.
Inquiry FormPlease use the form below to contact us with any questions you have regarding ZYGO's laser interferometer systems, or precision optical metrology in general.
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