3D Optical Profilers
Custom Metrology Solutions
IR Testing Measure near IR and short-wave IR optics at their design wavelength.Verifire™ MST Multiple Surface Test laser interferometer system provides high precision measurements of surface form and transmitted wavefront of optical components and lens systems. It is the only commercial interferometer system that can measure multiple surfaces – with a single measurement.
Near IR and Short-Wave IR TestingTesting at an optical system's design wavelength is critical for final alignment and qualification. Night vision, IR and thermal imaging systems for aerospace and defense, lithography subsystems, remote sensing telescopes, and exotic material qualification all require testing at design wavelength.
To meet this need, the Verifire™ MST interferometer system is available at 1.053 µm, 1.064 µm, and 1.55 µm wavelengths, in addition to the 633 nm model. This allows for measurements of homogeneity and TTV (total thickness variation) of materials that are not transmissive in the visible spectrum, such as Silicon. It also allows for testing at the operating wavelength for optics used in high-energy laser and free-space communication applications.
Still Easy to UseThe measurement procedures for NIR and SWIR wavelengths are identical to 633 nm systems, ensuring easy cavity setup, and measurement processing with ZYGO's Mx™ software.
Capable of Much More than Infrared MetrologyExplore these important features and capabilities of the Verifire™ MST interferometer system...
Inquiry FormPlease use the form below to contact us with any questions you have regarding infrared testing with ZYGO's Verifire MST interferometer system, or interferometry in general.
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