Optical Surface Profilers
Absolute Position Measurement
Stage Position Metrology
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Photovoltaic Panel Metrology Increasing efficiency while lowering costsZYGO's non-contact 3D optical profilers provide photovoltaic manufacturers with the process insight needed to improve production control for higher efficiencies and lower costs. To optimize etch processes and increase efficiency in photovoltaic cells, industry researchers rely on ZYGO optical profilers with Advanced Texture Analysis software. Film thickness is measured and analyzed on monocrystalline and polycrystalline silicon cell surfaces, and critical dimensions of conductive gridlines and laser scribe trenches are rapidly quantified, including height, depth, length, width, and volume.
3D Plot of Conductive Gridline
TCO Film Thickness Map
3D Plot of Cell Edge Isolation
ZYGO's unique 3D Cross Sectional Area (CSA) metrology helps you to optimize both optical and electrical efficiency. Reducing the CSA variation minimizes the Ag material outside the electron flow, thus minimizing wasted conductor.
Laser - Edge Isolation
TCO: Surface Roughness and Film Thickness
Laser Scribe: Depth, Width, Profile, and Debris
Info Request FormUse the form below to contact us with any questions you have regarding ZYGO 3D Optical Surface Profilers, photovoltaic panel metrology, or surface profiling in general.
Contact ZYGO today to learn more about ZYGO's metrology solutions for Photovoltaic Panels!