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NewView™ 9000 3D Optical Surface Profiler
High-sensitivity 1.9 MP sensor
Fast non-contact measurements
Superior 3D surface visualization
Ultra precision & gage capability
Enhanced optical imaging
Automated part setup
At the core of the system is ZYGO's Coherence Scanning Interferometry (CSI) technology which delivers sub-nanometer precision at all magnifications, and measures a wider range of surfaces faster and more precisely than other commercially-available technologies, thus optimizing your return on investment.
Performance, Value, and VersatilityFlexibility is the hallmark of ZYGO's NewView products. The NewView 9000 profiler offers exceptional value with applications as varied as flatness, roughness and waviness, thin films, step heights and more.
All NewView 9000 profilers are equipped with a triple-zoom turret which can be populated with discrete zoom optics tailor made for the system. Sample staging configurations range from completely manual to fully automated with encoded travel.
Regardless of your configuration, all NewView 9000 systems offer high-accuracy measurements, ease of use, and fast measurements, all at an attractive price point that make it the ideal choice for versatility and value in 3D optical profilers.
Some of the differentiated features targeted at making users' metrology better, faster, and more reliable:
Large-area 1.9 MP sensor with high sensitivity lets you see more in a single measurement
High-speed measurements take only seconds for improved productivity and process control
Automated part focus and setup minimizes operator variability and training while reducing the time to data
Gage-capable performance through exceptional precision and repeatability for the most demanding production applications.
Vibration robust metrology with SureScan technology and available built-in isolation enables high quality metrology even in vibration-prone environments
SmartPSI™ technology for ultra-fast profiling of ultra-smooth surfaces
2D and 3D correlation provides confidence in your measurements with results that comply to ISO 25178 and ISO 4287 standards.
Mx™ software for instrument control, analysis, and measurement automation
Advanced Analysis & Control Software
Mx Software Screen (click image for a larger view)
NewView 9000 Optical Profiling System
• Interactive 3D plots - zoom, pan, rotate, and update results in real time.
• Flexible Analyses - a wide array of quantitative results, data views, and filters are included.
• Intuitive user interface with a workflow-based design makes it easy to learn and use.
• Built in SPC analysis tools track results, monitor pass-fail criteria, and track process statistics.
Additional application modules for specific needs, such as measurement in the presence of transparent films, and 2D vision analysis, are available for those who require these capabilities.
Get a Demo!Use the form below to get more information, request a demonstration of the NewView 9000 profiler, or to arrange to send us your samples for a free analysis.
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