Guardian™ Industrial Enclosure

Optimize efficiency by using your ZYGO optical profiler right on the shop floor.

Guardian Industrial EnclosureNow you can meet the most rigorous standards for precision metrology under challenging environmental conditions. Our Guardian™ enclosures isolate the metrology core from the surrounding environment, so you get optimal performance when and where you need it. Designed and built by ZYGO exclusively for our optical profilers, Guardian™ enclosures are built to perform and last.

Ergonomic Design

The system is designed to be a self-contained unit, which can be operated from standing or seated positions. All user interface peripherals can be positioned and adjusted. A large front-side opening makes the task of loading and unloading test parts and fixtures simple and efficient. The unit's interior lighting conveniently illuminates the work area as well. For serviceability, access panels are also provided around the unit. 

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  • APPLICATION
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Durable, ergonomic and compact, the Guardian™ industrial enclosure for ZYGO 3D Optical Profilers provides protection from harsh environments, while maintaining performance and functionality.

Key Features:

  • Isolated metrology core
  • Compact footprint
  • Acoustical damping side panels
  • Ergonomic controls
  • Large access door with cover
  • Removable access panels for serviceability
  • Workspace lighting
  • Electronics cooling
  • High quality build and finish
  • Designed and built specifically for ZYGO optical profilers 
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Service Brochure
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Guardian Industrial Enclosure
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3D Optical Profiler Accessory Guide
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3D Optical Profilers
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Nexview™ NX2, NewView™ 9000, ZeGage™ Pro Objectives
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Service Brochure
DocumentBrochure
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Guardian Industrial Enclosure
DocumentBrochure
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3D Optical Profiler Accessory Guide
DocumentBrochure
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3D Optical Profilers
DocumentBrochure
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Nexview™ NX2, NewView™ 9000, ZeGage™ Pro Objectives
DocumentBrochure
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Mx™ Software Films Analysis
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Measuring Sub-Angstrom Surface Texture
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Measuring Dynamic MEMS Devices
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Identifying and Controlling Vibration
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PSD Analysis
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Vision Software Suite
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ABS Geometry and MetroPro® Calculations
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Getting the Most from the Advanced Texture Application
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Filtering on the NewView™
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Haze Controls Thin Film PV Performance
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Photovoltaic Panel Measurement on a NewView™
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Measuring with an Optical Diverter on a NewView
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Measuring Honed Surfaces with a NewView
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Diesel Fuel Injector Metrology
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Optical Profiling of High Slope Surfaces
Title
Document
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Mx™ Software Films Analysis
DocumentAN-0001
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Measuring Sub-Angstrom Surface Texture
DocumentAN-0002
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Measuring Dynamic MEMS Devices
DocumentAN-0003
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Identifying and Controlling Vibration
DocumentAN-0006
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PSD Analysis
DocumentAN-0009
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Vision Software Suite
DocumentAN-0011
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ABS Geometry and MetroPro® Calculations
DocumentAN-0012
Download Download
Getting the Most from the Advanced Texture Application
DocumentAN-0013
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Filtering on the NewView™
DocumentAN-0014
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Haze Controls Thin Film PV Performance
DocumentAN-0041
Download Download
Photovoltaic Panel Measurement on a NewView™
DocumentAN-0044
Download Download
Measuring with an Optical Diverter on a NewView
DocumentAN-0052
Download Download
Measuring Honed Surfaces with a NewView
DocumentAN-0053
Download Download
Diesel Fuel Injector Metrology
DocumentAN-0100
Download Download
Optical Profiling of High Slope Surfaces
DocumentAN-0103
Download Download
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Mx™ Quick-Start Guide
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Mx™ Reference Guide
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Mx™ Remote Access Guide
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Mx™ Surface Texture Parameters
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Mx™ Quick-Start Guide
DocumentOMP-0570D
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Mx™ Reference Guide
DocumentOMP-0550D
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Mx™ Remote Access Guide
DocumentOMP-0600A
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Mx™ Surface Texture Parameters
DocumentOMP-0608C
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3D Optical Profilers Are Enabling Reliable Engine Lightweighting
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A new class of wide-field objectives for 3D interference microscopy
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Accurate, repetitive, linear motion from biased piezoelectric actuators
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Advanced Metrology for Energy Efficiency
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Advances in optical metrology
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Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
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Applications of model-based transparent surface films analysis using coherence scanning interferometry
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Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
Title
Document
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3D Optical Profilers Are Enabling Reliable Engine Lightweighting
DocumentArticle
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A new class of wide-field objectives for 3D interference microscopy
DocumentTechnical Paper
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Accurate, repetitive, linear motion from biased piezoelectric actuators
DocumentTechnical Paper
Download Download
Advanced Metrology for Energy Efficiency
DocumentTechnical Paper
Download Download
Advances in optical metrology
DocumentTechnical Paper
Download Download
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
DocumentTechnical Paper
Download Download
Applications of model-based transparent surface films analysis using coherence scanning interferometry
DocumentTechnical Paper
Download Download
Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
DocumentTechnical Paper
Download Download
Challenges and solutions in the optical measurement of aspheres
DocumentTechnical Paper
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Characterization of materials and film stacks for accurate surface topography measurement using a white-light optical profiler
DocumentTechnical Paper
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