New Products Feature 2X Data Points and 2X Scan Speed


If you are heading to SPIE Photonics West in San Francisco (January 30 - Feb. 1, 2018), be sure to visit Zygo Corporation (booth #1223) to see the latest innovations in 3D surface metrology.

We are excited to showcase two new Optical Profiler products, NewView™ 9000 and Nexview™ NX2. These new products represent the latest additions to ZYGO's industry-leading flagship offerings, providing key benefits and advantages – from research to production applications.

  • 2X faster scan speed
  • 2X more data points
  • 30% higher sensitivity
  • Smart focus and set up

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    If you have a need for better surface finish, form and geometry measurements, or are looking for ways to improve your manufacturing processes, be sure to stop by booth #1223 and speak to our experts. Hands-on demonstrations are also available. Feel free to bring your sample parts for a free analysis – precisely and fast!