Advancements in Characterizing Film Thickness and Topography, Using Coherence Scanning Interferometry
Optically transparent films are common across many industries, and their function can critically depend on their thickness and surface texture. ZYGO optical profilers have long been the tool of choice for measuring micron-scale thickness optically transparent films on smooth surfaces. Now, recent advances have expanded the application space of this technique to sub-micron films and rough surfaces.
This webinar will provide an overview of the latest technologies using ZYGO’s Mx™ metrology software and 3D Optical Profiler products. We’ll explore innovative technology that enables advanced characterization of not only film thickness, but also surface texture and topography in a single measurement – without contact.
In this webinar, you will learn:
• What’s new - the latest advancement for comprehensive, quantitative characterization of optically transparent films.
• What’s possible - available software tools and capabilities to extend the applications of standard ZYGO 3D Optical Profilers.
• How it’s done - demonstration in setting up an application to enable rapid and precise film topography measurements.
Dan Russano is a Senior Applications Engineer at ZYGO Corporation. He has extensive expertise in the application of 3D optical metrology tools for non-contact metrology and characterization of surfaces and films