Efficiently Measuring and Quantifying Defects on Surfaces. More Than Meets the Eye.
This webinar explores a variety of methods for identifying and quantifying defects on different surfaces, which will allow you to determine the best defect analysis technique for your samples and learn how to employ the appropriate analysis tools in your process. We also provide an overview of defect analysis using ZYGO’s Mx™ metrology software.
You will learn about...
• Available software tools that can be leveraged to support and deploy a defect analysis solution.
• Understanding the right data processing techniques to effectively identify and analyze defects.
• Configuring an application to automate the process of defect detection and analysis.
Kyle Delldonna is an Applications Engineer at ZYGO Corporation. He has expertise in the application of 3D optical metrology tools for non-contact metrology and characterization of surfaces across a wide range of industry applications.