From Model to Measurement: Using Mx™ Data with Optical Design Software
Optical modeling and metrology encompass two major tasks in the development of an optical system. In this webinar, we explore how data can be shared from the ZYGO interferometer system to ray tracing software, to better understand the performance of an optical system.
Topics covered include:
• General overview of ZYGO Mx™ data file types for save/load and import/export
• Demonstration of adding ZYGO measurement data to Zemax OpticStudio® optical design software
• Modeling an optical system in Zemax OpticStudio® and subtracting from measurement in ZYGO Mx™ software
In this event, Eddie LaVilla, Senior Applications Engineer, Zygo Corporation, shares his experience using OpticStudio® with Mx™ interferometer data.