Optical Profilometers & 3D Optical Profilers
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
Choosing the right optical profiler system depends on your application's requirements, including speed, precision, vertical range, automation, and flexibility.
Nexview™ NX2
Highest performance system with the largest work volume. Automated sample staging and illumination enables advanced production applications, with superior research grade measurement precision. Like the NewView™ 9000 and ZeGage™ Pro, software and accessory options are configurable to meet your needs across a wide range of applications.
NewView™ 9000
High performance and configurable Optical profiler. Staging, software, and accessory options make it well suited for a wide range of applications, and enable it to evolve with your metrology needs!
ZeGage™ Pro
Standard performance CSI bench-top configuration with a compact design that is simple to use. Measure parts right on the shop floor!
Compass™ 2
Fast non-contact micro lens process metrology system for 3d surface metrology of aspheric micro lens modules and molds.
Nexview™ 650
The Nexview™ 650 metrology system provides precision automated measurement of injection molding tooling, PCBs, glass panels up to 650 x 650 mm.
Special Configurations
Large Format Inspection
The Nexview™ 650 is a large format inspection tool optimized for automated measurement of injection molding tooling, PCBs, glass panels and other samples requiring an extended work volume up to 650 x 650 mm. It provides both 2D & 3D measurements with sub-nanometer vertical precision and sub-micron lateral precision.
OEM Systems
ZYGO has a proven track record of delivering precise, high-speed 3D optical profiler sensors to OEM manufacturers and system integrators for the most challenging applications. These configurable systems are ideally suited for integration into automated production systems for in-line measurement and process control.
Industrial Enclosure
Durable, ergonomic and compact, the Guardian™ industrial enclosure for ZYGO 3D Optical Profilers provides protection from harsh environments, isolating the metrology core from the surrounding environment while maintaining full performance and functionality.
Micro Lens Metrology
For complete characterization of discrete micro lenses and their alignment features, ZYGO's Compass™ system provides full-surface, non-contact, 3D mapping of surface form and deviation, topography, and relational/dimensional metrology for small lenses and molds with sub-nanometer height precision.
Key Features of ZYGO 3D Optical Profilers...
SmartSetup™ Technology
Exclusive SmartSetup™ technology helps get measurement data from your ZYGO optical profiler more quickly by automating set up and configuration tasks. SmartSetup™ locates the sample surface, sets the light level and scan length, and takes a measurement – typically within 1 minute.
SureScan™ Technology
Vibration-tolerant SureScan™ technology combines innovative hardware and software, enabling a ZeGage™ 3D optical profiler to make high-precision measurements virtually anywhere in your manufacturing facility, even on the shop floor, without the need for a vibration isolation system.
Optical Profiler Objectives
Profiler objectives determine the magnification, working distance, slope capability, and field of view of the profiler (but not Z-height resolution, which is constant). The wide range of objectives ZYGO offers for its optical profilers is unmatched in the industry.
Mx™ Software
ZYGO's Mx™ software powers complete metrology system control & data analysis, including interactive 3D maps, quantitative topography data, intuitive navigation, & built-in SPC with statistics, control charting, and pass/fail limits.