Compass™

Micro Lens Process Metrology Systems

ZYGO's Compass™ metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact imaging systems such as automotive vision systems and cameras for smart phones and tablets.

There are two models of Compass™ systems available, depending on your metrology needs...

  • Compass – ZYGO's advanced solution for precision metrology of micro lens surface form and deviation, topography, and relational/dimensional parameters. This is the ideal choice for applications that require complete characterization of spherical or aspherical micro lenses and their alignment features.
  • Compass RT Metrology SystemCompass RT – A fast and flexible system for precision metrology of micro lens relational/dimensional parameters, plus general profilometry applications. This is the ideal choice when form deviation metrology is not required.

Powerful Analysis Software

The Compass systems are powered by ZYGO's comprehensive Mx™ software platform, providing the key functions of data acquisition, analysis and visualization, and instrument hardware automation. The Compass system's multi-functional architecture supports measurements of a wide range of parts and metrology parameters, including mold pins and discrete lenses.

  • MORE INFO
  • BROCHURES &
    SPEC SHEETS
  • APPLICATION
    NOTES
  • MANUALS
  • TECH PAPERS
  • VIDEOS

Production-Proven Technologies

At the core of the Compass system is ZYGO's optical profiler technology, based on Coherence Scanning Interferometry (CSI), which delivers industry-leading precision, versatility and speed for repeatable metrology and production process control. Unique to Compass™ and Compass™ RT are aspheric form and deviation metrology and relational / dimensional metrology of alignment features.

Form and Deviation

  • Full surface, non-contact, 3D mapping of surface form for spherical or aspherical lenses and molds
  • Sub-nanometer height precision of surface form and deviation, with millions of data points
  • Advanced analysis of form deviation from design prescription
  • Rapid and automated identification of process asymmetries
Lens-to-Datum Characterization

Relational/Dimensional Metrology

  • Quantitative metrology and inspection of mechanical design features on single or dual-sided lens elements
  • Datum and Lens-to-Datum Characterizations
  • Centration interlock diameter
  • Annular datum flatness, thickness, parallelism and wedge
  • Lens apex height, centration, center thickness and apex-to-apex centration 
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Compass
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3D Optical Profiler Accessory Guide
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3D Optical Profilers
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Nexview™ NX2, NewView™ 9000, ZeGage™ Pro Objectives
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Compass
Title
Document
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Compass
DocumentBrochure
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3D Optical Profiler Accessory Guide
DocumentBrochure
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3D Optical Profilers
DocumentBrochure
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Nexview™ NX2, NewView™ 9000, ZeGage™ Pro Objectives
DocumentBrochure
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Compass
DocumentSpecifications
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Form and Roughness
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Mx™ Software Films Analysis
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Measuring Sub-Angstrom Surface Texture
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Measuring Dynamic MEMS Devices
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Identifying and Controlling Vibration
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PSD Analysis
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Vision Software Suite
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ABS Geometry and MetroPro® Calculations
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Getting the Most from the Advanced Texture Application
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Filtering on the NewView™
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Haze Controls Thin Film PV Performance
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Photovoltaic Panel Measurement on a NewView™
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Measuring with an Optical Diverter on a NewView
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Measuring Honed Surfaces with a NewView
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Diesel Fuel Injector Metrology
Title
Document
Download Link
Form and Roughness
DocumentAB-0100
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Mx™ Software Films Analysis
DocumentAN-0001
Download Link Download
Measuring Sub-Angstrom Surface Texture
DocumentAN-0002
Download Link Download
Measuring Dynamic MEMS Devices
DocumentAN-0003
Download Link Download
Identifying and Controlling Vibration
DocumentAN-0006
Download Link Download
PSD Analysis
DocumentAN-0009
Download Link Download
Vision Software Suite
DocumentAN-0011
Download Link Download
ABS Geometry and MetroPro® Calculations
DocumentAN-0012
Download Link Download
Getting the Most from the Advanced Texture Application
DocumentAN-0013
Download Link Download
Filtering on the NewView™
DocumentAN-0014
Download Link Download
Haze Controls Thin Film PV Performance
DocumentAN-0041
Download Link Download
Photovoltaic Panel Measurement on a NewView™
DocumentAN-0044
Download Link Download
Measuring with an Optical Diverter on a NewView
DocumentAN-0052
Download Link Download
Measuring Honed Surfaces with a NewView
DocumentAN-0053
Download Link Download
Diesel Fuel Injector Metrology
DocumentAN-0100
Download Link Download
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Compass™ RT Operating Manual
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Optical Profiler Accessory Guide (for NewView 8/9000, & Nexview/NX2)
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Compass™ Operating Manual
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Mx™ Quick-Start Guide
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Mx™ Reference Guide
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Mx™ Remote Access Guide
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Mx™ Surface Texture Parameters
Title
Document
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Compass™ RT Operating Manual
DocumentOMP-0613A
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Optical Profiler Accessory Guide (for NewView 8/9000, & Nexview/NX2)
DocumentOMP-0594J
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Compass™ Operating Manual
DocumentOMP-0612A
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Mx™ Quick-Start Guide
DocumentOMP-0570D
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Mx™ Reference Guide
DocumentOMP-0550D
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Mx™ Remote Access Guide
DocumentOMP-0600A
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Mx™ Surface Texture Parameters
DocumentOMP-0608C
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3D Optical Profilers Are Enabling Reliable Engine Lightweighting
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A new class of wide-field objectives for 3D interference microscopy
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Accurate, repetitive, linear motion from biased piezoelectric actuators
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Advanced Metrology for Energy Efficiency
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Advances in optical metrology
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Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
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Applications of model-based transparent surface films analysis using coherence scanning interferometry
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Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
Title
Document
Download Link
3D Optical Profilers Are Enabling Reliable Engine Lightweighting
DocumentArticle
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A new class of wide-field objectives for 3D interference microscopy
DocumentTechnical Paper
Download Link Download
Accurate, repetitive, linear motion from biased piezoelectric actuators
DocumentTechnical Paper
Download Link Download
Advanced Metrology for Energy Efficiency
DocumentTechnical Paper
Download Link Download
Advances in optical metrology
DocumentTechnical Paper
Download Link Download
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
DocumentTechnical Paper
Download Link Download
Applications of model-based transparent surface films analysis using coherence scanning interferometry
DocumentTechnical Paper
Download Link Download
Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
DocumentTechnical Paper
Download Link Download
Challenges and solutions in the optical measurement of aspheres
DocumentTechnical Paper
Download Link Download
Characterization of materials and film stacks for accurate surface topography measurement using a white-light optical profiler
DocumentTechnical Paper
Download Link Download

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