Compass™

Micro Lens Process Metrology Systems

ZYGO's Compass™ metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact imaging systems such as automotive vision systems and cameras for smart phones and tablets.

There are two models of Compass™ systems available, depending on your metrology needs...

  • Compass – ZYGO's advanced solution for precision metrology of micro lens surface form and deviation, topography, and relational/dimensional parameters. This is the ideal choice for applications that require complete characterization of spherical or aspherical micro lenses and their alignment features.
  • Compass RT Metrology SystemCompass RT – A fast and flexible system for precision metrology of micro lens relational/dimensional parameters, plus general profilometry applications. This is the ideal choice when form deviation metrology is not required.

Powerful Analysis Software

The Compass systems are powered by ZYGO's comprehensive Mx™ software platform, providing the key functions of data acquisition, analysis and visualization, and instrument hardware automation. The Compass system's multi-functional architecture supports measurements of a wide range of parts and metrology parameters, including mold pins and discrete lenses.

  • MORE INFO
  • BROCHURES &
    SPEC SHEETS
  • APPLICATION
    NOTES
  • MANUALS
  • TECH PAPERS
  • VIDEOS

Production-Proven Technologies

At the core of the Compass system is ZYGO's optical profiler technology, based on Coherence Scanning Interferometry (CSI), which delivers industry-leading precision, versatility and speed for repeatable metrology and production process control. Unique to Compass™ and Compass™ RT are aspheric form and deviation metrology and relational / dimensional metrology of alignment features.

Form and Deviation

  • Full surface, non-contact, 3D mapping of surface form for spherical or aspherical lenses and molds
  • Sub-nanometer height precision of surface form and deviation, with millions of data points
  • Advanced analysis of form deviation from design prescription
  • Rapid and automated identification of process asymmetries
Lens-to-Datum Characterization

Relational/Dimensional Metrology

  • Quantitative metrology and inspection of mechanical design features on single or dual-sided lens elements
  • Datum and Lens-to-Datum Characterizations
  • Centration interlock diameter
  • Annular datum flatness, thickness, parallelism and wedge
  • Lens apex height, centration, center thickness and apex-to-apex centration 
img1
TitleCompass
img1
Title3D Optical Profiler Accessory Guide
img1
TitleCompass
Title
Document
Download Link
Compass
DocumentBrochure
Download Link Download
3D Optical Profiler Accessory Guide
DocumentBrochure
Download Link Download
Compass
DocumentSpecifications
Download Link Download
img1
TitleForm and Roughness
img1
TitleMx™ Software Films Analysis
img1
TitleMeasuring Sub-Angstrom Surface Texture
img1
TitleMeasuring Dynamic MEMS Devices
img1
TitleIdentifying and Controlling Vibration
img1
TitlePSD Analysis
img1
TitleVision Software Suite
img1
TitleABS Geometry and MetroPro® Calculations
img1
TitleGetting the Most from the Advanced Texture Application
img1
TitleFiltering on the NewView™
img1
TitleHaze Controls Thin Film PV Performance
img1
TitlePhotovoltaic Panel Measurement on a NewView™
img1
TitleMeasuring with an Optical Diverter on a NewView
img1
TitleMeasuring Honed Surfaces with a NewView
img1
TitleDiesel Fuel Injector Metrology
Title
Document
Download Link
Form and Roughness
DocumentAB-0100
Download Link Download
Mx™ Software Films Analysis
DocumentAN-0001
Download Link Download
Measuring Sub-Angstrom Surface Texture
DocumentAN-0002
Download Link Download
Measuring Dynamic MEMS Devices
DocumentAN-0003
Download Link Download
Identifying and Controlling Vibration
DocumentAN-0006
Download Link Download
PSD Analysis
DocumentAN-0009
Download Link Download
Vision Software Suite
DocumentAN-0011
Download Link Download
ABS Geometry and MetroPro® Calculations
DocumentAN-0012
Download Link Download
Getting the Most from the Advanced Texture Application
DocumentAN-0013
Download Link Download
Filtering on the NewView™
DocumentAN-0014
Download Link Download
Haze Controls Thin Film PV Performance
DocumentAN-0041
Download Link Download
Photovoltaic Panel Measurement on a NewView™
DocumentAN-0044
Download Link Download
Measuring with an Optical Diverter on a NewView
DocumentAN-0052
Download Link Download
Measuring Honed Surfaces with a NewView
DocumentAN-0053
Download Link Download
Diesel Fuel Injector Metrology
DocumentAN-0100
Download Link Download
img1
TitleCompass™ Operating Manual
img1
TitleCompass™ RT Operating Manual
img1
TitleOptical Profiler Accessory Guide (for NewView 8/9000, & Nexview/NX2)
img1
TitleMx™ Quick-Start Guide
img1
TitleMx™ Reference Guide
img1
TitleMx™ Remote Access Guide
img1
TitleMx™ Remote Access Quick Start Guide
img1
TitleMx™ Surface Texture Parameters
Title
Document
Download Link
Compass™ Operating Manual
DocumentOMP-0612A
Download Link Download
Compass™ RT Operating Manual
DocumentOMP-0613A
Download Link Download
Optical Profiler Accessory Guide (for NewView 8/9000, & Nexview/NX2)
DocumentOMP-0594J
Download Link Download
Mx™ Quick-Start Guide
DocumentOMP-0570D
Download Link Download
Mx™ Reference Guide
DocumentOMP-0550M
Download Link Download
Mx™ Remote Access Guide
DocumentOMP-0600A
Download Link Download
Mx™ Remote Access Quick Start Guide
DocumentOMP-0602A
Download Link Download
Mx™ Surface Texture Parameters
DocumentOMP-0608C
Download Link Download
img1
Title3D Optical Profilers Are Enabling Reliable Engine Lightweighting
img1
TitleA new class of wide-field objectives for 3D interference microscopy
img1
TitleAccurate, repetitive, linear motion from biased piezoelectric actuators
img1
TitleAdvanced Metrology for Energy Efficiency
img1
TitleAdvances in optical metrology
img1
TitleAngle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
img1
TitleApplications of model-based transparent surface films analysis using coherence scanning interferometry
img1
TitleCalibration of the amplification coefficient in interference microscopy by means of a wavelength standard
Title
Document
Download Link
3D Optical Profilers Are Enabling Reliable Engine Lightweighting
DocumentArticle
Download Link Download
A new class of wide-field objectives for 3D interference microscopy
DocumentTechnical Paper
Download Link Download
Accurate, repetitive, linear motion from biased piezoelectric actuators
DocumentTechnical Paper
Download Link Download
Advanced Metrology for Energy Efficiency
DocumentTechnical Paper
Download Link Download
Advances in optical metrology
DocumentTechnical Paper
Download Link Download
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
DocumentTechnical Paper
Download Link Download
Applications of model-based transparent surface films analysis using coherence scanning interferometry
DocumentTechnical Paper
Download Link Download
Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
DocumentTechnical Paper
Download Link Download
Challenges and solutions in the optical measurement of aspheres
DocumentTechnical Paper
Download Link Download
Characterization of materials and film stacks for accurate surface topography measurement using a white-light optical profiler
DocumentTechnical Paper
Download Link Download

* Required entries
 Required for USA and Canada
Note:
If you experience any difficulty submitting this form, contact: webmaster@zygo.com

** You may withdraw this consent at any time using the "unsubscribe" link at the bottom of any page on this web site.
X
By continuing to use this site, you agree to our Privacy and Cookie Policy
OK