Compass™ 2

 3d optical profiler compass 2ZYGO's Compass™ 2 metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact camera modules found in smart phones, tablets, and automotive vision systems.
At their core is ZYGO’s Coherence Scanning Interferometry (CSI) technology which delivers industry-leading precision, versatility and speed for repeatable metrology and production process control.

There are two models of Compass 2 systems available, depending on your metrology needs

  • Compass 2 – ZYGO's advanced solution for precision metrology of micro lens surface form, deviation from prescription, and relational/dimensional parameters. This is the ideal choice for applications that require the analysis of rotationally symmetric spherical and aspheric, geometrically truncated, and freeform surfaces.

  • Compass RT – A fast and flexible system for precision metrology of micro lens relational/dimensional parameters, plus general profilometry applications. This is the ideal choice when form deviation metrology is not required.
  • MORE INFO
  • BROCHURES &
    SPEC SHEETS
  • APPLICATION
    NOTES
  • MANUALS
  • TECH PAPERS
  • VIDEOS

Production-Proven Technologies

At the core of the Compass 2 system is ZYGO’s CSI based optical profiler technology, which delivers industry-leading precision, versatility and speed for repeatable metrology and production process control. Unique to Compass™ and Compass™ RT are aspheric form and deviation metrology and relational / dimensional metrology of alignment features.

Form and Deviation

  • Full surface, non-contact, 3D mapping of surface form for spherical, aspherical, and freeform lenses and molds with sub nanometer precision
  • Advanced analysis of form deviation from design prescription
  • Data integration with diamond turning machines for surface correction
Lens-to-Datum Characterization

Relational/Dimensional Metrology

  • Quantitative metrology and inspection of mechanical design features on single or dual-sided lens elements including Datum to Datum and Lens-to-Datum Characterizations
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Compass 2
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Service Brochure
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3D Optical Profiler Accessory Guide
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3D Optical Profilers
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Nexview™ NX2, NewView™ 9000, ZeGage™ Pro Objectives
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Compass 2
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Compass 2
DocumentBrochure
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Service Brochure
DocumentBrochure
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3D Optical Profiler Accessory Guide
DocumentBrochure
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3D Optical Profilers
DocumentBrochure
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Nexview™ NX2, NewView™ 9000, ZeGage™ Pro Objectives
DocumentBrochure
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Compass 2
DocumentSpecifications
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Mx™ Software Films Analysis
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Measuring Sub-Angstrom Surface Texture
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Measuring Dynamic MEMS Devices
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Identifying and Controlling Vibration
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PSD Analysis
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Vision Software Suite
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ABS Geometry and MetroPro® Calculations
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Getting the Most from the Advanced Texture Application
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Filtering on the NewView™
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Haze Controls Thin Film PV Performance
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Photovoltaic Panel Measurement on a NewView™
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Measuring with an Optical Diverter on a NewView
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Measuring Honed Surfaces with a NewView
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Diesel Fuel Injector Metrology
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Document
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Mx™ Software Films Analysis
DocumentAN-0001
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Measuring Sub-Angstrom Surface Texture
DocumentAN-0002
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Measuring Dynamic MEMS Devices
DocumentAN-0003
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Identifying and Controlling Vibration
DocumentAN-0006
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PSD Analysis
DocumentAN-0009
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Vision Software Suite
DocumentAN-0011
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ABS Geometry and MetroPro® Calculations
DocumentAN-0012
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Getting the Most from the Advanced Texture Application
DocumentAN-0013
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Filtering on the NewView™
DocumentAN-0014
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Haze Controls Thin Film PV Performance
DocumentAN-0041
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Photovoltaic Panel Measurement on a NewView™
DocumentAN-0044
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Measuring with an Optical Diverter on a NewView
DocumentAN-0052
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Measuring Honed Surfaces with a NewView
DocumentAN-0053
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Diesel Fuel Injector Metrology
DocumentAN-0100
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Compass™ Operating Manual
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Compass™ RT Operating Manual
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Optical Profiler Accessory Guide (for NewView 8/9000, & Nexview/NX2)
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Mx™ Quick-Start Guide
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Mx™ Reference Guide
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Mx™ Remote Access Guide
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Mx™ Surface Texture Parameters
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Compass™ Operating Manual
DocumentOMP-0612D
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Compass™ RT Operating Manual
DocumentOMP-0613B
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Optical Profiler Accessory Guide (for NewView 8/9000, & Nexview/NX2)
DocumentOMP-0594M
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Mx™ Quick-Start Guide
DocumentOMP-0570D
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Mx™ Reference Guide
DocumentOMP-0550D
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Mx™ Remote Access Guide
DocumentOMP-0600A
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Mx™ Surface Texture Parameters
DocumentOMP-0608C
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3D Optical Profilers Are Enabling Reliable Engine Lightweighting
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A new class of wide-field objectives for 3D interference microscopy
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Accurate, repetitive, linear motion from biased piezoelectric actuators
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Advanced Metrology for Energy Efficiency
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Advances in optical metrology
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Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
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Applications of model-based transparent surface films analysis using coherence scanning interferometry
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Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
Title
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3D Optical Profilers Are Enabling Reliable Engine Lightweighting
DocumentArticle
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A new class of wide-field objectives for 3D interference microscopy
DocumentTechnical Paper
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Accurate, repetitive, linear motion from biased piezoelectric actuators
DocumentTechnical Paper
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Advanced Metrology for Energy Efficiency
DocumentTechnical Paper
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Advances in optical metrology
DocumentTechnical Paper
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Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
DocumentTechnical Paper
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Applications of model-based transparent surface films analysis using coherence scanning interferometry
DocumentTechnical Paper
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Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
DocumentTechnical Paper
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Challenges and solutions in the optical measurement of aspheres
DocumentTechnical Paper
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Characterization of materials and film stacks for accurate surface topography measurement using a white-light optical profiler
DocumentTechnical Paper
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