Compass™ 2
ZYGO's Compass™ 2 metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact camera modules found in smart phones, tablets, and automotive vision systems.
At their core is ZYGO’s Coherence Scanning Interferometry (CSI) technology which delivers industry-leading precision, versatility and speed for repeatable metrology and production process control.
There are two models of Compass 2 systems available, depending on your metrology needs
- Compass 2 – ZYGO's advanced solution for precision metrology of micro lens surface form, deviation from prescription, and relational/dimensional parameters. This is the ideal choice for applications that require the analysis of rotationally symmetric spherical and aspheric, geometrically truncated, and freeform surfaces.
- Compass RT – A fast and flexible system for precision metrology of micro lens relational/dimensional parameters, plus general profilometry applications. This is the ideal choice when form deviation metrology is not required.
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Production-Proven Technologies
At the core of the Compass 2 system is ZYGO’s CSI based optical profiler technology, which delivers industry-leading precision, versatility and speed for repeatable metrology and production process control. Unique to Compass™ and Compass™ RT are aspheric form and deviation metrology and relational / dimensional metrology of alignment features.
Form and Deviation
- Full surface, non-contact, 3D mapping of surface form for spherical, aspherical, and freeform lenses and molds with sub nanometer precision
- Advanced analysis of form deviation from design prescription
- Data integration with diamond turning machines for surface correction
Relational/Dimensional Metrology
- Quantitative metrology and inspection of mechanical design features on single or dual-sided lens elements including Datum to Datum and Lens-to-Datum Characterizations
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Mx™ Software Films Analysis
Measuring Sub-Angstrom Surface Texture
Measuring Dynamic MEMS Devices
Identifying and Controlling Vibration
PSD Analysis
Vision Software Suite
ABS Geometry and MetroPro® Calculations
Getting the Most from the Advanced Texture Application
Filtering on the NewView™
Haze Controls Thin Film PV Performance
Photovoltaic Panel Measurement on a NewView™
Measuring with an Optical Diverter on a NewView
Measuring Honed Surfaces with a NewView
Diesel Fuel Injector Metrology
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Optical Profiler Accessory Guide (for NewView 8/9000, & Nexview/NX2)
DocumentOMP-0594M
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3D Optical Profilers Are Enabling Reliable Engine Lightweighting
A new class of wide-field objectives for 3D interference microscopy
Accurate, repetitive, linear motion from biased piezoelectric actuators
Advanced Metrology for Energy Efficiency
Advances in optical metrology
Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
Applications of model-based transparent surface films analysis using coherence scanning interferometry
Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
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A new class of wide-field objectives for 3D interference microscopy
DocumentTechnical Paper
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Accurate, repetitive, linear motion from biased piezoelectric actuators
DocumentTechnical Paper
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Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
DocumentTechnical Paper
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Applications of model-based transparent surface films analysis using coherence scanning interferometry
DocumentTechnical Paper
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Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
DocumentTechnical Paper
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Challenges and solutions in the optical measurement of aspheres
DocumentTechnical Paper
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Characterization of materials and film stacks for accurate surface topography measurement using a white-light optical profiler
DocumentTechnical Paper
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