Nexview™ 650: Large Format Inspection & Metrology

Large Format Inspection & Metrology

Nexview™ 650 metrology systemThe Nexview™ 650 metrology system is an inspection tool for automated measurement of injection molding tooling, PCBs, glass panels and other samples requiring an extended work volume up to 650 x 650 mm. It provides 2D & 3D measurements of a variety of surface features with sub-nanometer vertical precision and sub-micron lateral precision.

Powerful Performance

Coherence Scanning Interferometry (CSI) is the measurement technology at the core of the Nexview™ 650 system.

This non-contact technique provides high-precision, and high-value surface metrology benefits including:

  • Measures virtually all types of surfaces, from rough to super smooth, including thin films, steep slopes, and large steps.
  • Sub-nanometer measurement precision is independent of field magnification
  • Gage capable performance - exceptional precision and repeatability for the most demanding production applications.
  • SureScan™ vibration tolerance technology - robust operation in virtually any environment.
  • Mx™ software enables seamless data exchange with other ZYGO Profilers including ZeGage™ Pro, NewView™ 9000, and Nexview™ NX2.

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