Nexview™ NX2

Nexview NX2 3D Optical Profiler SystemDesigned for the most demanding applications, the Nexview™ NX2 3D optical profiler combines exceptional precision, advanced algorithms, application flexibility, and automation into a single package that represents ZYGO's most advanced Coherence Scanning Interferometric (CSI) profiler.

The completely non-contact technology optimizes the return on investment by delivering sub-nanometer precision at all magnifications and measuring a wider range of surfaces faster and more precisely than other comparable technologies commercially available. With applications as varied as flatness, roughness and waviness, thin films, step heights and more on virtually any surface and material, Nexview NX2 truly is the no-compromise profiler.

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As the latest generation flagship, Nexview™ NX2 provides a wide range of differentiated features targeted at making users' metrology better, faster, and more reliable:

  • Large-area 1.9 MP sensor with high sensitivity lets you see more in a single measurement
  • High-speed measurements take only seconds for improved productivity and process control
  • Automated part focus and setup minimizes operator variability and training while reducing the time to data
  • Gage capable performance through exceptional precision and repeatability for the most demanding production applications.
  • Vibration robust metrology with SureScan technology and built in isolation enables high quality metrology even in vibration-prone environments
  • SmartPSI™ technology for ultra-fast profiling of ultra-smooth surfaces
  • 2D and 3D correlation provides confidence in your measurements with results that comply to ISO 25178 and ISO 4287 standards.
  • Mx™ software for instrument control, analysis, and measurement automation
  • True Color imaging for enhanced visualization
  • Variable image zoom with three included zoom lenses lets users optimize the field of view and maximize instrument flexibility

The Only Profiler You Need

Nexview NX2 3D Optical Profiler System

You no longer have to select a profiler based on the type of surface you want to measure. The Nexview™ NX2 profiler measures topography of virtually any surface from a super polished optical surface with sub-Angstrom surface roughness, to steep machined angles up to 85 degrees. It does all this in 3D, without contact, and provides the best qualities of other profiling technologies (stylus, confocal, focus scanning) without their shortcomings.

Additional application modules for specific needs, such as measurement in the presence of transparent films, and 2D vision analysis, are available for customers that require these capabilities.

Automated Operation

The Nexview™ NX2 profiler is a fly-by-wire tool with no manual controls, so it can be fully automated with programmed sequences to measure multiple areas of a surface, multiple parts in a tray, or larger surfaces by stitching together multiple measurements into a single measurement.

Clean, Streamlined, Design

The Nexview NX2 profiler features a large work area with clear lines of sight to help make measurement setups and changeovers simple and quick.

Its automated 200 mm integrated measurement stage is the epitome of clean and efficient industrial design. It features an embedded ±4 degree high load tilt stage with parcentric correction – which makes aligning the measurement surface simple, even for featureless samples. 

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TitleNexview™ NX2
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Title3D Optical Profiler Accessory Guide
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TitleNexview™ NX2, NewView™ 9000, ZeGage™ Pro Objectives
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TitleNexview NX2
Title
Document
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Nexview™ NX2
DocumentBrochure
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3D Optical Profiler Accessory Guide
DocumentBrochure
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Nexview™ NX2, NewView™ 9000, ZeGage™ Pro Objectives
DocumentBrochure
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Nexview NX2
DocumentSpecifications
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TitleForm and Roughness
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TitleMx™ Software Films Analysis
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TitleMeasuring Sub-Angstrom Surface Texture
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TitleMeasuring Dynamic MEMS Devices
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TitleIdentifying and Controlling Vibration
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TitlePSD Analysis
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TitleVision Software Suite
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TitleABS Geometry and MetroPro® Calculations
Title
Document
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Form and Roughness
DocumentAB-0100
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Mx™ Software Films Analysis
DocumentAN-0001
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Measuring Sub-Angstrom Surface Texture
DocumentAN-0002
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Measuring Dynamic MEMS Devices
DocumentAN-0003
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Identifying and Controlling Vibration
DocumentAN-0006
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PSD Analysis
DocumentAN-0009
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Vision Software Suite
DocumentAN-0011
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ABS Geometry and MetroPro® Calculations
DocumentAN-0012
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Getting the Most from the Advanced Texture Application
DocumentAN-0013
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Filtering on the NewView™
DocumentAN-0014
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TitleNexview™ NX2 Operating Manual
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TitleNexview™ NX2 Návod k obsluze
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TitleNexview™ NX2 Mode d’emploi
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TitleNexview™ NX2 Manuale di istruzioni
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TitleNexview™ NX2 İşletim Kılavuzu
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TitleNexview™ NX2 CE DICHIARAZIONE DI CONFORMITÀ
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TitleOptical Profiler Accessory Guide (for NewView 8/9000, & Nexview/NX2)
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TitleMx™ Quick-Start Guide
Title
Document
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Nexview™ NX2 Operating Manual
DocumentOMP-0618C
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Nexview™ NX2 Návod k obsluze
DocumentOMP-0618A (Czech)
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Nexview™ NX2 Mode d’emploi
DocumentOMP-0618A (French)
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Nexview™ NX2 Manuale di istruzioni
DocumentOMP-0618A (Italian)
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Nexview™ NX2 İşletim Kılavuzu
DocumentOMP-0618A (Turkish)
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Nexview™ NX2 CE DICHIARAZIONE DI CONFORMITÀ
DocumentZYG18-003 (Italian)
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Optical Profiler Accessory Guide (for NewView 8/9000, & Nexview/NX2)
DocumentOMP-0594J
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Mx™ Quick-Start Guide
DocumentOMP-0570D
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Mx™ Reference Guide
DocumentOMP-0550D
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Mx™ Remote Access Guide
DocumentOMP-0600A
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Title3D Optical Profilers Are Enabling Reliable Engine Lightweighting
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TitleA new class of wide-field objectives for 3D interference microscopy
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TitleAccurate, repetitive, linear motion from biased piezoelectric actuators
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TitleAdvanced Metrology for Energy Efficiency
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TitleAdvances in optical metrology
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TitleAngle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
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TitleApplications of model-based transparent surface films analysis using coherence scanning interferometry
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TitleCalibration of the amplification coefficient in interference microscopy by means of a wavelength standard
Title
Document
Download Link
3D Optical Profilers Are Enabling Reliable Engine Lightweighting
DocumentArticle
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A new class of wide-field objectives for 3D interference microscopy
DocumentTechnical Paper
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Accurate, repetitive, linear motion from biased piezoelectric actuators
DocumentTechnical Paper
Download Link Download
Advanced Metrology for Energy Efficiency
DocumentTechnical Paper
Download Link Download
Advances in optical metrology
DocumentTechnical Paper
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Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry
DocumentTechnical Paper
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Applications of model-based transparent surface films analysis using coherence scanning interferometry
DocumentTechnical Paper
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Calibration of the amplification coefficient in interference microscopy by means of a wavelength standard
DocumentTechnical Paper
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Challenges and solutions in the optical measurement of aspheres
DocumentTechnical Paper
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Characterization of materials and film stacks for accurate surface topography measurement using a white-light optical profiler
DocumentTechnical Paper
Download Link Download

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