Computer Generated Hologram (CGH)

Complex asphere metrology ideally suited for production-level volumes

Computer Generated Hologram

Advances in diamond turning and small-tool deterministic polishing have dramatically increased optical manufacturing capabilities to produce nearly any surface shape. Designers have leveraged these capabilities by increasingly designing aspheric optics into imaging, sensing and laser systems to improve performance and reduce size and weight of optical systems. 

However, it isn’t just the polishing equipment that is required to produce high quality aspheric optics – metrology is required to guide polishing and material removal from the surface to converge to an ideal surface figure that matches the design closely.

A CGH (Computer Generated Hologram) is an optical null element that creates a unique wavefront enabling interferometric testing of complex optical surfaces including freeform, gullwing and off-axis aspheric shapes.

Zygo’s Verifire VTS and Verifire™ Asphere products are ideally suited for CGH application for production-level asphere and freeform optics. 

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A CGH extends the capability of standard Zygo laser interferometers by modifying the test wavefront to a specific surface prescription. The result is a metrology setup that leverages many of the benefits of Fizeau interferometry:

  • Fast measurement tact time
  • High resolution measurement
  • High precision measurement
  • Low implementation cost
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Computer Generated Hologram White Paper
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Service Brochure
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Computer Generated Hologram White Paper
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Service Brochure
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Laser damage properties of Al2O3/MgF2 antireflection coatings on large curved substrates at 248 nm
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Solutions for environmentally robust interferometric optical testing
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101 Frame Algorithm For Phase Shifting Interferometry
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A next-generation optical surface form inspection instrument for high-volume production applications
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A review of selected topics in interferometric optical metrology
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Absolute distance measurements using FTPSI with a widely tunable IR laser
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Absolute Interferometric Testing of Spherical Surfaces
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Absolute Measurement of Rotationally Symmetrical Aspheric Surfaces
Title
Document
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Laser damage properties of Al2O3/MgF2 antireflection coatings on large curved substrates at 248 nm
DocumentArticle
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Solutions for environmentally robust interferometric optical testing
DocumentTechnical Paper
Download Download
101 Frame Algorithm For Phase Shifting Interferometry
DocumentTechnical Paper
Download Download
A next-generation optical surface form inspection instrument for high-volume production applications
DocumentTechnical Paper
Download Download
A review of selected topics in interferometric optical metrology
DocumentTechnical Paper
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Absolute distance measurements using FTPSI with a widely tunable IR laser
DocumentTechnical Paper
Download Download
Absolute Interferometric Testing of Spherical Surfaces
DocumentTechnical Paper
Download Download
Absolute Measurement of Rotationally Symmetrical Aspheric Surfaces
DocumentTechnical Paper
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Adjustable coherence depth in a geometrically-desensitized interferometer
DocumentTechnical Paper
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Advances in optical metrology
DocumentTechnical Paper
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