QPSI Technology

Animated comparison of a PSI measurement with fringe print-through due to vibration, and the same surface measured with QPSI™ technology – free of noisy print-through.

ZYGO's patented QPSI™ technology is truly a breakthrough in precision optical testing – it eliminates noise and ripple in phase data due to small vibrations, providing reliable data that would otherwise be noisy with traditional PSI acquisition. QPSI measurements require no special setup or calibration, and cycle times are typically equivalent to standard PSI measurements.

QPSI is available exclusively from ZYGO and is included as standard equipment on Verifire, DynaFiz, Verifire HD, Verifire MST, and many infrared and large aperture interferometer systems. These systems are easy-to-use, on-axis, common-path Fizeau interferometers – the industry standard for reliable metrology – making them the logical choice for most optical surface form and transmitted wavefront measurements.

 
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A ZYGO interferometer with QPSI technology enables reliable high-precision measurements in the presence of vibration from common sources such as motors, pumps, blowers, and personnel.

The patented on-axis temporal phase shifting acquisition is enabled by unique software algorithms, as well as the ZYGO-made HeNe laser which delivers higher power to freeze vibration on a frame-by-frame basis.

Key Features:

  • Eliminates ripple and fringe print-through due to vibration
  • High-precision measurement; same as phase-shifting interferometry (PSI)
  • Requires no calibration, and no changes to your setup
  • Easily enabled/disabled with a mouse click
  • Included with all standard ZYGO interferometer mainframes
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TitleMetrology in Production Environments - QPSI Technology
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TitleMeasurement of Aspheric Surfaces
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TitleDetermining Asphere Measurability
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TitleGrazing Incidence Testing
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TitleInterferogram Scale Factor
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TitleSilver Overcoat Spray
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TitleTesting Cylindrical Surfaces with Computer Generated Holograms
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TitleFringe Analysis versus Phase Measuring Interferometry
Title
Document
Download Link
Metrology in Production Environments - QPSI Technology
DocumentAB-0102
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Measurement of Aspheric Surfaces
DocumentAN-0007
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Determining Asphere Measurability
DocumentAN-0008
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Grazing Incidence Testing
DocumentAN-0010
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Interferogram Scale Factor
DocumentAN-0015
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Silver Overcoat Spray
DocumentAN-0016
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Testing Cylindrical Surfaces with Computer Generated Holograms
DocumentAN-0017
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Fringe Analysis versus Phase Measuring Interferometry
DocumentAN-0018
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Finite Conjugate Lens Testing
DocumentAN-0019
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Testing Cylindrical Optics
DocumentAN-0020
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TitleSolutions for environmentally robust interferometric optical testing
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Title101 Frame Algorithm For Phase Shifting Interferometry
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TitleA next-generation optical surface form inspection instrument for high-volume production applications
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TitleA review of selected topics in interferometric optical metrology
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TitleAbsolute distance measurements using FTPSI with a widely tunable IR laser
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TitleAbsolute Interferometric Testing of Spherical Surfaces
img1
TitleAbsolute Measurement of Rotationally Symmetrical Aspheric Surfaces
img1
TitleAdjustable coherence depth in a geometrically-desensitized interferometer
Title
Document
Download Link
Solutions for environmentally robust interferometric optical testing
DocumentTechnical Paper
Download Link Download
101 Frame Algorithm For Phase Shifting Interferometry
DocumentTechnical Paper
Download Link Download
A next-generation optical surface form inspection instrument for high-volume production applications
DocumentTechnical Paper
Download Link Download
A review of selected topics in interferometric optical metrology
DocumentTechnical Paper
Download Link Download
Absolute distance measurements using FTPSI with a widely tunable IR laser
DocumentTechnical Paper
Download Link Download
Absolute Interferometric Testing of Spherical Surfaces
DocumentTechnical Paper
Download Link Download
Absolute Measurement of Rotationally Symmetrical Aspheric Surfaces
DocumentTechnical Paper
Download Link Download
Adjustable coherence depth in a geometrically-desensitized interferometer
DocumentTechnical Paper
Download Link Download
Advances in optical metrology
DocumentTechnical Paper
Download Link Download
Applications of optical coherence in interferometric metrology
DocumentTechnical Paper
Download Link Download

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